A Pattern of Success: Calibre Pattern Matching

A Pattern of Success: Calibre Pattern Matching

Calibre Pattern Matching enables innovative DRC and other applications across all process nodes and designs.

A new path for analog design constraints verification

A new path for analog design constraints verification

By Dina Medhat, Mentor Graphics Accurate verification of explicitly-defined analog design constraints is crucial for reliability and performance.

All Together Now: FOWLP in the Foundry

All Together Now: FOWLP in the Foundry

By John Ferguson, Mentor Graphics FOWLP design popularity is driving foundries to develop in-house FOWLP flows. How will that affect…

Fill/Cut Self-Aligned Double-Patterning

Fill/Cut Self-Aligned Double-Patterning

By David Abercrombie, Rehab Ali, Ahmed Hamed-Fatehy, and Shetha Nolke How the SID-SADP process affects your design decisions –

Creating An Accurate FEOL CMP Model

Creating An Accurate FEOL CMP Model

By Ruben Ghulghazaryan, Jeff Wilson, and Ahmed AbouZeid FEOL CMP modeling helps designers and foundries predict CMP hotspots in advanced…

Transistor level ESD verification in large SoC designs

Transistor level ESD verification in large SoC designs

Dina Medhat, Mentor Graphics ESD protection is critical, but difficult to verify. Using voltage propagation and logic-aware checks can help

Context-Aware Latch-up Checking

Context-Aware Latch-up Checking

By Matthew Hogan, Mentor Graphics Latch-up detection is challenging. Learn how automated LUP checks help you find and eliminate LUP…

The Pitfalls of Auto-Stitching in Double-Patterning

The Pitfalls of Auto-Stitching in Double-Patterning

By David Abercrombie, Mentor Graphics Untimely DP stitching can cause more problems than it solves, that’s why strategic use is…

Established Technology Nodes: The Most Popular Kid at the Dance

Established Technology Nodes: The Most Popular Kid at the Dance

By Michael White, Mentor Graphics Established nodes have a lot of dancing left to do! Learn how and why new…