DFM: Still a really good thing to do!

By Simon Favre If you’re not using critical area analysis and design for manufacturing to…

What is critical area analysis and why should I care?

By Simon Favre What makes money in the semiconductor industry? A killer IC design? Something…

Machine learning-enabled closed loop DFM

SPIE-ing at a distance…

The SPIE Advanced Lithography Digital Forum took place Feb 22-26, and of course, Siemens EDA…

Using machine learning to improve DFM: a case study

By Ruben Ghulghazaryan, Davit Piliposyan, Misak Shoyan – Mentor, A Siemens Business It has been…

Direct write DEF is DEFinitely the way to go for DFM back-annotation

By Armen Asatryan, James Paris – Mentor, A Siemens Business DFM back-annotation to P&R Back-annotation…

Back-annotating DFM enhancements to place & route tools

By James Paris, Mentor Graphics Back-annotation of DFM enhancements to P&R simplifies iterations as designers…

Synthesis of Design Rules and Patterns

By Michael White, Mentor Graphics Integrating pattern matching with design verification and process development yields…

Reliability Scoring for the Automotive Market

By Jeff Wilson, Mentor Graphics Companies designing automotive electronics must understand how variability affects design…

Deja Vu for CMP Modeling?

By Jeff Wilson, Mentor Graphics With manufacturing innovations and new DFM solutions, CMP modeling is…