Back-annotating DFM enhancements to place & route tools

By James Paris, Mentor Graphics Back-annotation of DFM enhancements to P&R simplifies iterations as designers…

Synthesis of Design Rules and Patterns

By Michael White, Mentor Graphics Integrating pattern matching with design verification and process development yields…

Reliability Scoring for the Automotive Market

By Jeff Wilson, Mentor Graphics Companies designing automotive electronics must understand how variability affects design…

Deja Vu for CMP Modeling?

By Jeff Wilson, Mentor Graphics With manufacturing innovations and new DFM solutions, CMP modeling is…

The Fill Ecosystem Evolves Again

By Jeff Wilson, Mentor Graphics At 20nm, new fill constraints drive up the time and…

Video: ECO Fill Flow Framework

A video introduction to Mentor’s newly introduced utility called ecofill….

Automated Chip Polishing Can Make Your Design Shine

By Bill Graupp, Mentor Graphics A more robust design creates a more reliable product, and…

Are Three Eyes Better Than Two?

By David Abercrombie, Mentor Graphics Error analysis in triple patterning is challenging, but a pyramid…

Balancing on the Color Density Tightrope

By David Abercrombie Potential pitfalls and available solutions….