Latest posts

How to extend DTCO for today’s competitive IC landscape

By Le Hong As semiconductor components continue to shrink, the challenges associated with design-for-manufacturing (DFM) and design-technology co-optimization (DTCO) increase….

Sanity check: Will automated fill back-annotation help?

By James Paris Hey there, custom integrated circuit (IC) design engineers! If you’re knee-deep in the world of IC design,…

Streamlining semiconductor verification with the Calibre Interactive interface

By Slava Zhuchenya In the world of semiconductors, creating and verifying IC designs is no cakewalk. It’s a complex dance…

IC designers: let’s talk about shift left strategies

By John Ferguson In the constantly evolving world of electronics, where demands are high for more powerful, efficient, and reliable…

Transistor-level EMIR analysis from custom design tools? It’s all about flexibility!

By Roger Kang How do you run transistor-level electromigration and voltage drop (EMIR) analysis—command line or an interactive invocation GUI?…

Save yourself the time—here’s a way for you to view native block instances from a full-chip context

By Ritu Walia Imagine this: You primarily work on the design of a sub-block of an application-specific layout design, or…

Calibre PERC checks meet Calibre RVE default views: A match made in debugging heaven?

By Neel Natekar As technology node scaling continues, integrated circuit (IC) designers are facing increasing physical verification challenges due, in…

A recap of Calibre at DAC 2023

DAC is back! At least was the feeling on the floor, judging by the number of attendees we talked to,…

Updating a Calibre DesignEnhancer via insertion kit is fast and easy!

By Jimmy Tien The Calibre® DesignEnhancer Via use model provides an automated via insertion process based on foundry design rule…