Latest Posts

Collaboration and innovation thrive on diversity

Back in November 2019, just a few short months before we all began an enforced…

What is critical area analysis and why should I care?

By Simon Favre What makes money in the semiconductor industry? A killer IC design? Something…

Adaptive Patterning: Moving with the times (and technologies)

By John Ferguson and Kevin Rinebold Deca Technologies’ Adaptive Patterning technology and their newly-announced adaptive…

Building a strong reliability foundation with Calibre PERC

By Matthew Hogan How are you handling your reliability verification right now? Custom reliability verification?…

Machine learning-enabled closed loop DFM

SPIE-ing at a distance…

The SPIE Advanced Lithography Digital Forum took place Feb 22-26, and of course, Siemens EDA…

Early circuit verification can get you to tapeout faster…here’s how

For the last few years, it’s been hard to see design teams struggling to meet…

Automated ESD protection verification for 2.5-3D ICs is now a reality

Got the mid-winter blahs? The post-New Year letdown? Looking for something to rev you up?…

Stochasticity of the input current is an important factor in accurate EM assessment for on-chip power delivery networks

At every conference, there is always that anticipatory moment just before the coveted “Best Paper”…

2021: Time to simplify your life (or at least your workload)?

Everyone makes resolutions for a better life at the start of a new year –…