Stay ahead with our expert insights on advanced IC design and manufacturing. Discover Calibre verification breakthroughs, yield and process improvement strategies and the latest trends driving performance and efficiency in advanced technologies.
By Karen Chow, Mentor Graphics Electromigration can destroy an IC before its time. Are your designs safe?
By Matthew Hogan, Mentor Graphics Using your foundry’s reliability rule deck early on lets you correct reliability issues while they…
By Jonathan Muirhead and Geir Eide, Mentor Graphics Analyzing fail data with pattern matching helps companies identify yield limiters faster…
By Jeff Wilson, Mentor Graphics Companies designing automotive electronics must understand how variability affects design quality and reliability.
By John Ferguson, Mentor Graphics FO-WLP combines multiple die from heterogeneous processes into a compact package, and that’s a good…
By Matthew Hogan, Mentor Graphics Fast simulation and PEX are both crucial to interconnect robustness verification. Can your tools scale…
By Michael White, Mentor Graphics Automated pattern matching can solve a wide range of design verification issues. Are you in…
By Yousry Elmaghraby, Mentor Graphics Choosing the best PEX method for your full-chip or SoC design is essential. But how…
By David Abercrombie and Alex Pearson, Mentor Graphics Applying ECOs to multipatterned designs can be a nightmare, unless you plan…
