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Correct by Construction and Other Myths

Correct by Construction and Other Myths

December 8, 2015

By Joseph Davis, Mentor Graphics Is “correct by construction” a myth?

By Design With Calibre
5 MIN READ
Why Do We Need Assembly Design Kits for Packages?

Why Do We Need Assembly Design Kits for Packages?

December 1, 2015

By John Ferguson and Tarek Ramadan, Mentor Graphics Why do we need assembly design kits for IC packages?

By Design With Calibre
4 MIN READ
Reported Death of Moore’s Law Premature?

Reported Death of Moore’s Law Premature?

November 10, 2015

By Michael White, Mentor Graphics Is Moore’s Law dying? A look at the latest process node activity and technology

By Design With Calibre
5 MIN READ
Together At Last – Combining Netlist and Layout Data for Power-Aware Verification

Together At Last – Combining Netlist and Layout Data for Power-Aware Verification

November 3, 2015

By Beth Martin, with Sridhar Srinivasan, Yi-Ting Lee, and Frank Feng, Mentor Graphics Reliability checks on multiple-power-domain and mixed-signal designs…

By Design With Calibre
4 MIN READ
MEMS Technology and Manufacturing on the Microscale

MEMS Technology and Manufacturing on the Microscale

October 27, 2015

By Carey Robertson and Khaled AbouZeid, Mentor Graphics Designers incorporating MEMS devices into high-volume CMOS ICs need new processes, data,…

By Design With Calibre
6 MIN READ
Deja Vu for CMP Modeling?

Deja Vu for CMP Modeling?

October 20, 2015

By Jeff Wilson, Mentor Graphics With manufacturing innovations and new DFM solutions, CMP modeling is gaining renewed popularity

By Design With Calibre
5 MIN READ
Parasitic extraction for touchscreen designs

Parasitic extraction for touchscreen designs

October 6, 2015

By Mohamed ElRefaee, Mentor Graphics Accurate parasitic extraction of touchscreens is essential for ensuring the high-quality performance the market demands

By Design With Calibre
5 MIN READ
Electrical Overstress Detection and Debugging

Electrical Overstress Detection and Debugging

September 29, 2015

By Dina Medhat, Mentor Graphics Automated voltage propagation provides an accurate way to detect and correct those hard-to-find EOS conditions…

By Design With Calibre
5 MIN READ
Case Studies in P&R Double Patterning Debug: Part Two

Case Studies in P&R Double Patterning Debug: Part Two

September 22, 2015

David Abercrombie continues his expert advice to P&R and chip finishing engineers on understanding and debugging multi-patterning errors accurately and…

By Design With Calibre
8 MIN READ