By Mustafa Naeem, Ahmed Tahoon, Omar Ragi, and Reem El-Adawi In the realm of software testing, accurately tracking and analyzing…
By John Ferguson IC design’s evolution continues to push the boundaries of Moore’s law to new heights. One of the…
By Dilan Heredia and Karen Chow Designing integrated circuits (ICs) for the 3 nm process node poses challenges never seen…
By Derong Yan Integrated circuit (IC) chip designers are constantly striving to meet ever-increasing standards of reliability and performance in…
By Kesmat Shahin As integrated circuits (ICs) become more complex, meeting tapeout schedules has become increasingly challenging. Statistics from industry…
By Roger Kang How do you run transistor-level electromigration and voltage drop (EMIR) analysis—command line or an interactive invocation GUI?…
By Dina Medhat Context-aware physical verification (PV) is a relatively new addition to traditional PV flows, but it has quickly…
By Michael White and David Abercrombie In recent months, it seems as though everyone’s been talking about shift left as…
By Hossam Sarhan and Alexandre Arriordaz With the increasing complexity of design layouts and shorter tapeout cycles, waiting until signoff…