Transistor-level EMIR analysis from custom design tools? It’s all about flexibility!

By Roger Kang How do you run transistor-level electromigration and voltage drop (EMIR) analysis—command line or an interactive invocation GUI?…

Optimize metal fill insertion while protecting critical nets and devices…automatically!

By Dina Medhat Context-aware physical verification (PV) is a relatively new addition to traditional PV flows, but it has quickly…

What’s all the fuss about shift left?

By Michael White and David Abercrombie In recent months, it seems as though everyone’s been talking about shift left as…

How can I run reliability checks early in the design cycle?

By Hossam Sarhan and Alexandre Arriordaz With the increasing complexity of design layouts and shorter tapeout cycles, waiting until signoff…

ERC softchk features

The secret superpower of early design verification

By Kesmat Shahin How many times, as you traversed across design stages and ran countless iterations, have you wished that…

Struggling to verify the reliability of your multiple-power-domain designs?

By Hossam Sarhan With the growing complexity of system-on-chip designs and technology scaling, multiple power domains are needed to optimize…

Efinix Titanium FPGAs depend on mPower power integrity analysis

By John Wagnon Efinix’s high-performance Titanium FPGAs are custom-tailored for the computing demands of mainstream applications, targeting markets from intelligent…

Google, AMD, and Siemens EDA walk into a cloud…

By Michael White At DAC this past July, I had the opportunity to sit down with Phil Steinke from AMD…

Can you spot the difference?

By James Paris We’ve all played those “Spot the Difference” games where you look at two similar images and try…