Automated ESD protection verification for 2.5-3D ICs is now a reality

Got the mid-winter blahs? The post-New Year letdown? Looking for something to rev you up? How about an automated method…

Stochasticity of the input current is an important factor in accurate EM assessment for on-chip power delivery networks

At every conference, there is always that anticipatory moment just before the coveted “Best Paper” awards are announced. After all,…

2021: Time to simplify your life (or at least your workload)?

Everyone makes resolutions for a better life at the start of a new year – why not resolve to make…

GLOBALFOUNDRIES and Mentor Launch a New Innovative DRC+ Hotspot Solution using Machine Learning in Calibre

By Shelly Stalnaker – Mentor, A Siemens Business I recently had the chance to attend an on-demand webinar introducing the…

Mentor receives 2020 TSMC OIP Partner of the Year awards for EDA solutions

By Shelly Stalnaker – Mentor, A Siemens Business While the structure of the TSMC OIP Ecosystem Forum had to change…

Verification run configurations stressing you out? Automate them!

By Srinivas Velivala – Mentor, A Siemens Business As all new IC verification engineers learn very quickly, there is far…

SAFE at home! Attending the Samsung SAFE forum in 2020

By Shelly Stalnaker – Mentor, A Siemens Business Samsung is going virtual with their 2020 SAFE forum, and Mentor, a…

Do you have a reliable automated waiver process for reliability verification?

By Dina Medhat – Mentor, A Siemens Business Design rule waivers Maybe a design rule that made sense at 22nm…

SAMP series finishes with SAMP cut mask decomposition techniques

By David Abercrombie and Rehab Kotb Ali – Mentor, A Siemens Business We’ve been writing about self-aligned multi-patterning (SAMP) topics…