Securing your silicon: Why automated IP integrity is non-negotiable in modern SoC design

Ensure IP integrity in your SoC designs. Discover how Calibre IP Checker detects hidden IP modifications, prevents costly re-spins and accelerates tape-out.

Bridging the gap: Unlock seamless collaboration in IC design with Calibre Connectivity Interface

Calibre Connectivity Interface (CCI) seamlessly connects EDA tools for advanced IC design verification. It transforms LVS into a powerful data source, enabling critical analyses like parasitic extraction & power integrity.

The IC designers complete guide to design rule checking

Design rule checking (DRC) ensures IC layouts meet foundry rules. Learn how modern DRC engines like Calibre deliver scalable, sign-off accuracy at advanced nodes

IC visualization: Supercharge debug of hidden parasitic threats with Calibre

By Omar Elabd If you’ve ever watched your simulation pass with flying colors, only to see your silicon fail in…

Boost simulation results with powerful selective net extraction with Calibre xACT

By Karen Chow In advanced integrated circuit (IC) design, post-layout parasitic extraction is crucial for accurate performance analysis and optimization….

Safeguarding IC reliability: Calibre PERC’s latch-up guard ring check

Ensure robust latch-up protection in your ICs with Calibre PERC’s comprehensive ESDA verification checks. Identify and resolve issues early, improve reliability, and accelerate time-to-market.

Driving 3D IC innovation with Calibre multiphysics 

Explore how Siemens EDA’s multiphysics workflow helps design teams to overcome the thermal, stress and reliability challenges of 3D ICs. Learn why early, integrated analysis with tools like Calibre 3DSTACK and Innovator3D IC is critical to success in advanced chiplet design.

Siemens-imec collaboration reduces stochastic failures in EUV lithography by orders of magnitude in wafer-level experimental validation

Siemens stochastic-aware OPC reduces EUV stochastic failures at wafer level for SRAM and logic, validating predictive modeling with experimental data.

Enhancing IC Verification: Smarter solutions for faster, more reliable designs

By Jonathan Muirhead Modern chip layouts are more intricate than ever, incorporating a mix of custom and third-party intellectual property…