Latest Posts

IoT, Cost-per-Transistor Extend Lifetimes of Established Technology Nodes

By Michael White, Mentor Graphics Much of the Internet of Things (IoT) functionality we crave…

How Close Can We Put Different Voltage Regions Together?

By Joe Davis, Mentor Graphics  Calibre tools provide a complete flow for implementing, optimizing, and…

Parasitic Extraction of FinFET-based Memory Cells

By Karen Chow, Mentor Graphics Accurate and efficient FinFET characterization requires a parasitic extraction tool…

Autonomous Systems and IC Reliability

By Matthew Hogan, Mentor Graphics New standards for IC quality and reliability verification…

Balancing on the Color Density Tightrope

By David Abercrombie Potential pitfalls and available solutions….

Rule Deck Comparison Doesn’t Have to be Difficult

By Saunder Peng Comparing results from different rule decks can be frustrating. Learn how you…

Capacity Constraints and DFM at Mature Nodes

By Jeff Wilson, Mentor Graphics Design for manufacturing – it’s a variety of practices that…

How to Use Pattern Matching to Improve Automatic Waiver Management

By John Ferguson and Jonathan Muirhead, Mentor Graphics Ensuring a known level of quality…

Migrating Consumer Electronics to the Automotive Market with Calibre PERC

By Matthew Hogan, Mentor Graphics Calibre PERC can help you succeed in the automotive market…