Latest posts

Time is money…so why waste it on bad data?

By James Paris Last Saturday was my son’s birthday and we had many things to do to get ready for…

Shining a light on silicon photonics verification

By John Ferguson, Omar ElSewefy, Nermeen Hossam, Basma Serry We’re all fascinated by light. Light beams shooting from aliens’ eyes,…

ESD protection verification in 2.5/3D ICs is HARD (or is it?) Our on-demand webinar has the answer

By Calibre Staff Electrostatic discharge (ESD) is a big worry for integrated circuit (IC) designers, for good reason. A bit…

SAFE is good. SAFE awards are even better…

By Calibre staff Safe is good, right? We all want to be safe, especially these days. But safe took on…

Turn IC verification challenge from a hard slog into a walk in the park by using static checks

By Neel Natekar As integrated circuits (ICs) grow in complexity, they create new challenges for IC verification flows and electronic…

A SAMPle of what you need to know about SAMP technology

By Calibre Design Staff Prior to the availability of extreme ultraviolet (EUV) lithography, multi-patterning provided the only workable yield solution…

Realize Live + U2U: Side by Side

What a difference a year can make! Oh, we’re not referring to that virus that shifted the Earth on its…

Give me my space! Why high voltage and multiple power domain designs need automated context-aware spacing checks

By Sherif Hany and Abdellah Bakhali Regardless of which technology node they’re using, design houses that create high-voltage and multiple…

DFM: Still a really good thing to do!

By Simon Favre If you’re not using critical area analysis and design for manufacturing to improve your IC yield and…