Latest posts

Video: Reducing test pattern count with testpoints

Learn how Qualcomm reduced test pattern count using Tessent testpoint technology. This video was recorded at the 2023 European User2User conference.

Video: Testonica uses Tessent IJTAG to implement an FPGA-based reference system

Learn how Testonica used Tessent to implement an FPGA-based reference system for pre-silicon evaluation and validation of a target IJTAG infrastructure. This video was recorded at the 2023 European User2User conference.

Video: NXP Semiconductors success with Tessent for in-system test for ISO 26262

Learn how NXP Semiconductors implemented in-system test for automotive devices using Tessent, recorded at the 2023 European User2User conference.

Video: Intel uses Tessent SSN for IC test and bring-up

Hear about Intel’s use of Tessent SSN for test and silicon bring up, recorded at the 2023 European User2User conference.

Image showing the architecture of a bus-based packetized scan test delivery system. Each core’s DFT can be designed independently and with the most optimal compression configuration.

Video: System-on-chip ATPG with Tessent SSN

Learn how Intel adopted Tessent SSN packet-based ATPG and reduced test time by 34% in this video recorded at the 2023 North America U2U symposium.

Video: Developing DFT flow for 3D IC at Broadcom

Learn how Broadcom used Tessent Multi-die to build a 3D IC flow in this video recorded at the 2023 North America U2U symposium.

Video: Using defect oriented test to target bridges in automotive designs

Learn how NXP achieves zero defects for bridging defects with Tessent’s defect oriented test in this video recorded at the 2023 North America U2U symposuim.

Video: Break through yield barriers with Siemens and PDF

Break through yield barriers with Siemens and PDF Solutions. Watch this video recorded at the 2023 North America U2U symposuim.

Illustration showing that IJTAG lets embedded IP all speak the same language

What’s up with the IEEE 1687 and 1149.1 refresh?

There’s lots of action right now in refreshing popular test standards and developing new ones. Read this update on the friends and family of IEEE 1149.1 JTAG and IEEE 1687 IJTAG.