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GlobalFoundries and Mentor create a breakthrough for scan diagnosis with machine learning

GlobalFoundries and Mentor create a breakthrough for scan diagnosis with machine learning

Improve yield and failure analysis by detecting, refining, clarifying, and resolving defects inside standard cells.

Using Less Power At The Same Node

Using Less Power At The Same Node

Excerpt from article: “Using Less Power At The Same Node“ “GPUs and artificial intelligence do require the new nodes, but it is…

SemiWiki: Mentor Showcases Digital Twin Demo

SemiWiki: Mentor Showcases Digital Twin Demo

Excerpt from article: “Mentor Showcases Digital Twin Demo“ Siemens EDA put on a very interesting tutorial at DVCon this year. Commonly…

Tech Design Forum: Catapult HLS Integrates eFPGA IP for Faster Development

Tech Design Forum: Catapult HLS Integrates eFPGA IP for Faster Development

Excerpt from article: “Catapult HLS Integrates eFPGA IP for Faster Development“ Siemens EDA is looking to extend the configurability options…

Meet aggressive time-to-market for AI chips by slashing DFT time

Meet aggressive time-to-market for AI chips by slashing DFT time

Semiconductor companies are racing to develop AI-specific chips to meet the rapidly growing compute requirements for artificial intelligence (AI) systems….

Janusz Rajski Earns a Lifetime Achievement Award

Janusz Rajski Earns a Lifetime Achievement Award

Motivated by purpose; realized through collaboration. Janusz Rajski has received a prestigious Siemens Lifetime achievement award in recognition of his…

New Tools to Accelerate Silicon Debug and Bring-Up: a free webinar from Mentor and Teradyne

New Tools to Accelerate Silicon Debug and Bring-Up: a free webinar from Mentor and Teradyne

Don’t miss this free, one-hour, web-based seminar on December 6 from 11am-12pm PST if you want to learn how to…

ATE-Connect changes the silicon debug and bring-up flow

ATE-Connect changes the silicon debug and bring-up flow

By Matt Knowles – Mentor, A Siemens Business The breakthrough ATE-Connect™ technology erases the gap between automatic test equipment and…

Don’t miss this ITC event – Test for the Autonomous Age

Don’t miss this ITC event – Test for the Autonomous Age

Test for the Autonomous Age, TUESDAY, OCT 30, at 10:45 am