Don’t miss this ITC event – Test for the Autonomous Age

Test for the Autonomous Age, TUESDAY, OCT 30, at 10:45 am

Will you be at International Test Conference and International Symposium on Test & Failure Analysis in Phoenix, AZ? If so, be sure to catch Mentor’s special session just after the keynote on Tuesday. It will feature Mentor’s DFT luminary Janusz Rajski, along with eSilicon’s Joseph Reynick and Intel’s William Howell.

The three short presentations all focus on how to make the promises of the autonomous age a reality. Highlights of DFT for the autonomous age include:

  • How to best implement DFT on large complex designs and new architectures that are required for efficient Al and machine learning
  • Getting high test quality and fast yield ramps with advanced process technologies incorporating 3D transistors
  • Strategies for meeting the requirements of a growing number of market segments like automotive that have strict quality and functional safety requirements

In addition to great speakers and thoughtful discussions, participants will also be entered to win a great prize.

For details on the Tessent technologies that are enabling fast and high-quality DFT, silicon bring-up, and failure diagnosis visit ISTFA Booth 415 and ITC Booth ITC Booth 301. We are featuring a live demonstration of the new ATE-Connect technology that you’ll want to see.

For more on Mentor’s activities at ITC and ISTFA, click here

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This article first appeared on the Siemens Digital Industries Software blog at https://blogs.sw.siemens.com/tessent/2018/10/26/dont-miss-this-itc-event-test-for-the-autonomous-age/