Hierarchical designs that are tile-based or abutment based physical blocks are predominant in today’s chips. Having no logic present at the chip-level calls for new approaches to testing these tile-based architectures. How a design for test (DFT) architecture can support tile-based designs is the focus of this presentation from U2U 2022.
The role of test is expanding from its traditional role into one that includes managing the entire silicon lifecycle. To…
Excerpt from article: “DeepChip: Joe Sawicki on ML, Calibre, Solido, VC funding, and heuristics” Cooley: I mean, what, are you…
