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Join Tessent at the VOICE Developer Conference

Tessent invites you to join us at the upcoming VOICE Developer Conference happening virtually from…

New resources explain on-chip monitoring and analysis with Tessent Embedded Analytics SDK

Large and complex SoCs with embedded systems play a big role in the technology we…

Read the 2020 ITC paper: Tessent Streaming Scan Network

At the 2020 International Test Conference, a paper by scientists from Siemens Digital Industries Software…

RealizeLIVE + User2User

Don’t miss these Tessent sessions at Realize LIVE + User2User event – May 26, 2021

Explore the latest DFT, operations and embedded analytics technologies at Realize LIVE + U2U 2021….

Manage the effects of chip complexity with Embedded Analytics

By Richard Oxland – Siemens Digital Industries Software If you’ve never heard of Embedded Analytics,…

VTS 2020 best paper_Tessent

Tessent wins Best Paper award at IEEE VLSI Test Symposium

The best paper of the 2020 symposium describes a layout-friendly EDT decompressor that reduces routing…

Secure and Up-to-date: Monitor and Control Automotive devices with Over-the-Air Updates

By Lee Harrison – Automotive Test Solutions Manager, Siemens EDA The topic of safety and…

Tessent Silicon Lifecycle Solutions

What is silicon lifecycle management?

The next step in IC test and monitoring by Aileen Ryan – Senior Director of…

Tessent LBIST with Observation Scan Technology Wins Elektra Design Tool Award 2020

A Tessent technology was awarded the 2020 Elektra Design Tools and Development Software Award from…