Featured Posts

Latest Posts

Introducing Tessent Streaming Scan Network

Slash test costs and reduce implementation effort for complex next-generation SoCs. IC engineering teams have…

Tessent’s ITC 2020 wrap-up

The International Test Conference carried on this year as a virtual event. It’s a difficult…

DFT and the competitive edge

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of…

Tessent Wraps Up Summer Webinar Series

The summer of 2020 featured several new webinars from the Tessent Test Solutions group at…

Video: ITC India 2020 keynote—Test community can take on silicon lifecycle challenges

The role of test is expanding from its traditional role into one that includes managing…

Using critical area to optimize test patterns

In a new technical paper, Ron Press, the director of technology enablement for the Tessent…

DFT Seminar: Using critical-area weighted optimization for more effective test patterns

The world of ATPG just changed with the introduction of a new solution that can…

Tune in to ITC India 2020

Mentor’s Tessent group is excited to participate in ITC India on July 12-14, 2020. While…

Summer learning series seminar: Improving the throughput of volume scan diagnosis

Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and…