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Tessent LBIST with Observation Scan Technology Wins Elektra Design Tool Award 2020

A Tessent technology was awarded the 2020 Elektra Design Tools and Development Software Award from…

Improve defect detection for competitive, high-quality SoCs

To deliver the highest quality SoCs, these manufacturing test strategies ensure defects are detected before…

Introducing Tessent Streaming Scan Network

Slash test costs and reduce implementation effort for complex next-generation SoCs. IC engineering teams have…

Tessent’s ITC 2020 wrap-up

The International Test Conference carried on this year as a virtual event. It’s a difficult…

DFT and the competitive edge

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of…

Tessent Wraps Up Summer Webinar Series

The summer of 2020 featured several new webinars from the Tessent Test Solutions group at…

Video: ITC India 2020 keynote—Test community can take on silicon lifecycle challenges

The role of test is expanding from its traditional role into one that includes managing…

Using critical area to optimize test patterns

In a new technical paper, Ron Press, the director of technology enablement for the Tessent…

DFT Seminar: Using critical-area weighted optimization for more effective test patterns

The world of ATPG just changed with the introduction of a new solution that can…