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How Infineon reduces LBIST test time to meet functional safety requirements

The ICs designed for use in advanced driver assistance systems or autonomous vehicles must meet…

The quest for optimal DFT automation

End-to-End automation keeps DFT out of the critical path…

Broadcom case study using Tessent Connect to build DFT flow for AI chips

Broadcom developed an advanced, highly automated DFT flow for some of it’s biggest chips targeting…

Tessent awarded by Samsung

Everyone benefits from close collaborations between all the players in the semiconductor ecosystem….

On-demand seminar: Improving the throughput of volume scan diagnosis

Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and…

Trends in DFT…according to you

A look at the top downloaded Tessent whitepapers reveals DFT challenges…

Cut in-system time for automotive ICs

A new logic built-in-self-test (LBIST) technology significantly improves cycle time for in-system tests of automotive…

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Learn about how Mentor and our partners, Advantest and Teradyne, are getting behind the IEEE…

Test technologies enabling AI

At the Silicon Valley DFT and Test Conference in Santa Clara, CA on October 23,…