Video: NXP Semiconductors success with Tessent for in-system test for ISO 26262

By Tessent Solutions

At the 2023 European User2User conference, Arjen Bakker, Senior DFT engineer at NXP, describes their experience using Tessent Hybrid TK/LBIST in-system test to facilitate functional safety (ISO 26262) on their Automotive Zonal ethernet switch. He shares the entire trajectory from specification to implementation using the Tessent Hybrid TK/LBIST flow and the Tessent Mission Mode controller with an APB interface.

The presentation was recorded and is now available for anyone to view.

Bakker discusses the DFT architecture and the implications of introducing an IJTAG network into an existing design. He also covers the clocking strategy, scan chain architecture and production test. The end result, a Tessent TK/LBIST-based extension of the standard NXP DFT process, ensures a re-usable, scalable and documented DFT architecture for the next generation of Automotive Ethernet Switch devices.

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This article first appeared on the Siemens Digital Industries Software blog at