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Tessent awarded by Samsung

Everyone benefits from close collaborations between all the players in the semiconductor ecosystem….

On-demand seminar: Improving the throughput of volume scan diagnosis

Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and…

Trends in DFT…according to you

A look at the top downloaded Tessent whitepapers reveals DFT challenges…

Cut in-system time for automotive ICs

A new logic built-in-self-test (LBIST) technology significantly improves cycle time for in-system tests of automotive…

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Learn about how Mentor and our partners, Advantest and Teradyne, are getting behind the IEEE…

Test technologies enabling AI

At the Silicon Valley DFT and Test Conference in Santa Clara, CA on October 23,…

50 Years of International Test Conference

In 1970, the Beatles officially split, Apollo 13 narrowly averted disaster, paisley and stripes somehow…

Video tutorial: How to Increase Volume Scan Diagnosis Throughput by 10X

Performing volume scan diagnosis on today’s large, advanced node designs puts outsized demands on turn-around-time…

Employing a Hierarchical Methodology for SoC Testing

When faced with a complex problem, engineers often employ a divide and conquer approach to…