At the 2023 Design Automation Conference (DAC), Lee Harrison, director of product marketing for automotive solutions for the Tessent group at Siemens EDA, presented the Tessent test solutions used for functional safety and automotive applications.
The presentation was recorded live and is now available for anyone to view.
He covers the standards and requirements for safety in the automotive world and how to use Tessent test tsolutions as safety mechanisms, how to use data monitoring through the product lifecycle.
DFT and silicon test is traditionally thought of as manufacturing and in-system test that ensures a semiconductor device is free of defects. Automotive ICs require a very high quality/low defect rate. The fault coverage achieved determines what ASIL safety level the IC can target. Tessent has automotive grade fault models to ensure high-quality manufacturing test and effective in-system test.
Functional safety is the other aspect of automotive ICs, which requires that the IC remains defect free throughout the device’s lifecycle. This essential capability is achieved through the use of embedded device monitoring with the Tessent Embedded Analytics tools.