At the 2021 IEEE International Test Conference, Tessent experts are presenting on bringing 1149.10 to life, progress in scan test…
A Tessent technology was awarded the 2020 Elektra Design Tools and Development Software Award from a crowded field of nominated…
By Steve Pateras, Mentor Graphics Ensure quality and reliability in automotive ICs with the newest technologies in silicon test.
By Steve Pateras, Mentor Graphics Memory BIST is evolving to meet the demands of automotive ICs.
