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ISO26262

Don’t miss it: Automotive Test and Reliability at ITC-Asia 2021

August 16, 2021

At the 2021 IEEE International Test Conference, Tessent experts are presenting on bringing 1149.10 to life, progress in scan test…

By Tessent Solutions
2 MIN READ

Tessent LBIST with Observation Scan Technology Wins Elektra Design Tool Award 2020

April 9, 2021

A Tessent technology was awarded the 2020 Elektra Design Tools and Development Software Award from a crowded field of nominated…

By Tessent Solutions
3 MIN READ
Automotive Semiconductor Test

Automotive Semiconductor Test

January 27, 2016

By Steve Pateras, Mentor Graphics Ensure quality and reliability in automotive ICs with the newest technologies in silicon test.

By Tessent Solutions
10 MIN READ
Memory BIST for automotive designs

Memory BIST for automotive designs

January 13, 2016

By Steve Pateras, Mentor Graphics Memory BIST is evolving to meet the demands of automotive ICs.  

By Tessent Solutions
4 MIN READ