Video: STMicroelectronics improves test quality with Tessent defect-oriented test

By Tessent Solutions

At the 2023 European User2User conference, Fatma Messaoui, Product & DFT engineer at STMicroelectronics discusses using Tessent defect-oriented test to cover bridge and open defects, thus improving test quality. STMicroelectronics is pursuing this technology to improve quality for their automotive customers.

Messaoui shares their research and lessons learned. The presentation was recorded and is now available for anyone to view.

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This article first appeared on the Siemens Digital Industries Software blog at