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Maximize diagnosis throughput with Dynamic Partitioning

Maximize diagnosis throughput with Dynamic Partitioning

Charged with the task of improving yield, product engineers need to find the location of defects in manufactured ICs quickly…

DFT for AI chips draws a crowd at ITC India tutorial

DFT for AI chips draws a crowd at ITC India tutorial

At the recently concluded ITC India conference, Mentor experts presented the two highest-attended tutorials. One tutorial was AI Chip Technologies…

How-to implement hierarchical DFT on Arm cores

How-to implement hierarchical DFT on Arm cores

The new reference flow jointly developed by Arm and Mentor for hierarchical DFT and ATPG with Tessent is described in…

DFT architectural tips: the importance of reference flows

DFT architectural tips: the importance of reference flows

This video, the last in a series of three, discusses the Tessent platform capabilities and the reference flows, test cases,…

DFT architectural tips: use of boundary scan chain during ATPG

DFT architectural tips: use of boundary scan chain during ATPG

DFT designers often use boundary scan chains for 1149.1 or 1149.6 interconnect tests. This video provides tips on how to…

DFT architectural tips: testing of asynchronous sets/resets

DFT architectural tips: testing of asynchronous sets/resets

Learn about the DFT logic that can be used to disable and enable sets/resets.

What’s happening at SEMICON West?

What’s happening at SEMICON West?

SEMICON West is happening this week, again at the Moscone Center in San Francisco. SEMICON West seems to grow in…

How-to create comprehensive test coverage reports during hierarchical DFT

How-to create comprehensive test coverage reports during hierarchical DFT

Rick Fisette – Mentor, A Siemens Business This three-part video series shows how to use the Tessent Shell automation features…

eSilicon Masters DFT and IP test for a deep learning SiP with Tessent

eSilicon Masters DFT and IP test for a deep learning SiP with Tessent

eSilicon used the Tessent family of DFT solutions to solve their toughest challenges of testing a large 2.5D/3D deep learning…