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Designing Ultra Low Power AI Processors

Designing Ultra Low Power AI Processors

Excerpt from article: “Designing Ultra Low Power AI Processors” “What makes power such a challenge to get right in an…

Video: Joe Sawicki on DFT and life-cycle management

Video: Joe Sawicki on DFT and life-cycle management

At the 2019 International Test conference, Joseph Sawicki, Executive Vice President of IC EDA at Mentor, a Siemens Business, delivered…

New Ways To Optimize Machine Learning

New Ways To Optimize Machine Learning

Excerpt from article: “New Ways To Optimize Machine Learning” Some projects are experimenting with larger strides. A stride of 2 means…

A leap forward for in-system test for automotive ICs

A leap forward for in-system test for automotive ICs

An improvement to BIST improves test coverage and time to improve functional safety of automotive ICs

SemiWiki: Mentor Masterclass on ML SoC Design

SemiWiki: Mentor Masterclass on ML SoC Design

Excerpt from article: “Mentor Masterclass on ML SoC Design” I was scheduled to attend the Siemens EDA tutorial at DVCon…

How Infineon reduces LBIST test time to meet functional safety requirements

How Infineon reduces LBIST test time to meet functional safety requirements

The ICs designed for use in advanced driver assistance systems or autonomous vehicles must meet stringent functional safety standards that…

The quest for optimal DFT automation

The quest for optimal DFT automation

End-to-End automation keeps DFT out of the critical path

Broadcom case study using Tessent Connect to build DFT flow for AI chips

Broadcom case study using Tessent Connect to build DFT flow for AI chips

Broadcom developed an advanced, highly automated DFT flow for some of it’s biggest chips targeting the artificial intelligence (AI) market…

Tessent awarded by Samsung

Tessent awarded by Samsung

Everyone benefits from close collaborations between all the players in the semiconductor ecosystem.