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SemiWiki: High-Level Synthesis at the Edge

SemiWiki: High-Level Synthesis at the Edge

Excerpt from article: “High-Level Synthesis at the Edge” Custom AI acceleration continues to gather steam. In the cloud, Alibaba has…

SemiEngineering: Reducing Power At RTL

SemiEngineering: Reducing Power At RTL

Excerpt from article: “Reducing Power At RTL” Other issues Integration is also a consideration. “Accuracy of the power efficiency analysis…

On-demand seminar: Improving the throughput of volume scan diagnosis

On-demand seminar: Improving the throughput of volume scan diagnosis

Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and compute resources. Mentor offers a…

Trends in DFT…according to you

Trends in DFT…according to you

A look at the top downloaded Tessent whitepapers reveals DFT challenges

SemiEngineering: Divided On System Partitioning

SemiEngineering: Divided On System Partitioning

Excerpt from article: “Divided On System Partitioning” Building an optimal implementation of a system using a functional description has been…

Priorities Shift In IC Design

Priorities Shift In IC Design

Excerpt from article: “Priorities Shift In IC Design” The rush to the edge and new applications around AI are causing…

Cut in-system time for automotive ICs

Cut in-system time for automotive ICs

A new logic built-in-self-test (LBIST) technology significantly improves cycle time for in-system tests of automotive devices.

SemiEngineering: Improving Algorithms With High-Level Synthesis

SemiEngineering: Improving Algorithms With High-Level Synthesis

Excerpt from article: “Improving Algorithms With High-Level Synthesis” Most computer algorithms today are developed in high-level languages on general-purpose computers….

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Learn about how Mentor and our partners, Advantest and Teradyne, are getting behind the IEEE 1149.10 standard for re-use of…