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Don’t Miss the Silicon Valley DFT Conference

Don’t Miss the Silicon Valley DFT Conference

Coming up soon, September 27th and 28th, is the Silicon Valley DFT and Test Conference  Aside from offering a keynote…

The value of Cell-aware ATPG and diagnosis for automotive ICs

The value of Cell-aware ATPG and diagnosis for automotive ICs

By Stephen Pateras – Mentor, A Siemens Business Automobiles are quickly transitioning from a simple means of transportation to a…

To improve yield, find the design-sensitive defects

To improve yield, find the design-sensitive defects

By Matt Knowles – Mentor, A Siemens Business Whether you are trying to accelerate yield ramp on a new process…

Boost FinFET Yield with Cell-aware Scan Diagnosis

Boost FinFET Yield with Cell-aware Scan Diagnosis

By Matt Knowles – Mentor, A Siemens Business FinFETs display more defects at the transistor level, which also tend to…

Yield is Money

Yield is Money

By Matt Knowles – Mentor, A Siemens Business Have yield issues delayed your product introduction or sales? Would a 1%…

Mentor at SEMICON West

Mentor at SEMICON West

SEMICON West  fills the Moscone Center again this year with the entire electronics supply chain. You are guaranteed to learn…

My Self-driving Car Should Work Right Every Time

My Self-driving Car Should Work Right Every Time

By Stephen Pateras – Mentor, A Siemens Business I think I speak for us all when I say that strict…

Control test cost with low pin count test

Control test cost with low pin count test

By Rahul Singhal – Mentor, A Siemens Business Several design trends, including increased design sizes and the use of advanced…

The growing presence of IC Test and Yield Analysis at DAC

The growing presence of IC Test and Yield Analysis at DAC

DAC was once the playground for the core EDA topics but has broadened in a reflection of the growing connectedness…