Gearing up for ITC 2017

ITC, the International Test Conference runs from Oct 31-Nov 2 in Fort Worth, Texas. This is the conference to attend if you are involved in electronic test of devices, boards, and systems. Mentor, a Siemens Business, is a top sponsor and is well represented in technical sessions.

You can find details of Mentor activities and sessions here.

 

At the Mentor booth, you will not only find the usual giveaways and demos, but a series of Theater Sessions in which Mentor and its customers and partners share success stories in DFT, test, and yield analysis. There is something new to learn each hour of the day, no matter if you are looking to manage test cost, improve yield ramp and mature yield, or tackle the challenges of DFT for complex, giga-gate designs.

 

One hot topic in test this year is DFT for automotive ICs. There has been a rapid increase in the amount and complexity of electronics designed to bring ADAS and autonomous driving capabilities to passenger cars. These devices must meet the ISO 26262 functional safety standard and the entire electronics industry is responding. Mentor’s Tessent product family has solutions for the challenges of testing today’s automotive ICs, including hybrid compression/BIST, Tessent DefectSim analog fault simulator, new test points, and cell-aware test and diagnosis. Mentor will hold a special event to introduce Tessent MissionMode, which provides system-level low latency access to all on-chip test resources for on-line test and diagnosis.

 

So register now and come by the Mentor booth, #301, for customer success presentations and product demos.

 

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This article first appeared on the Siemens Digital Industries Software blog at https://blogs.sw.siemens.com/tessent/2017/10/09/gearing-up-for-itc-2017/