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Test technologies enabling AI

Test technologies enabling AI

At the Silicon Valley DFT and Test Conference in Santa Clara, CA on October 23, the tight-knit community of DFT…

50 Years of International Test Conference

50 Years of International Test Conference

In 1970, the Beatles officially split, Apollo 13 narrowly averted disaster, paisley and stripes somehow went together, and the International…

Video tutorial: How to Increase Volume Scan Diagnosis Throughput by 10X

Video tutorial: How to Increase Volume Scan Diagnosis Throughput by 10X

Performing volume scan diagnosis on today’s large, advanced node designs puts outsized demands on turn-around-time and compute resources. Mentor offers…

Employing a Hierarchical Methodology for SoC Testing

Employing a Hierarchical Methodology for SoC Testing

When faced with a complex problem, engineers often employ a divide and conquer approach to efficiently come up with a…

Automotive electronics innovations in test quality

Automotive electronics innovations in test quality

The rapid development of advanced driver assistance systems and autonomous vehicles has grabbed the world’s attention and imagination. While true…

Maximize diagnosis throughput with Dynamic Partitioning

Maximize diagnosis throughput with Dynamic Partitioning

Charged with the task of improving yield, product engineers need to find the location of defects in manufactured ICs quickly…

DFT for AI chips draws a crowd at ITC India tutorial

DFT for AI chips draws a crowd at ITC India tutorial

At the recently concluded ITC India conference, Mentor experts presented the two highest-attended tutorials. One tutorial was AI Chip Technologies…

How-to implement hierarchical DFT on Arm cores

How-to implement hierarchical DFT on Arm cores

The new reference flow jointly developed by Arm and Mentor for hierarchical DFT and ATPG with Tessent is described in…

DFT architectural tips: the importance of reference flows

DFT architectural tips: the importance of reference flows

This video, the last in a series of three, discusses the Tessent platform capabilities and the reference flows, test cases,…