By Karen Chow, Mentor Graphics Accurate and efficient FinFET characterization requires a parasitic extraction tool that can apply different extraction…
By Matthew Hogan, Mentor Graphics New standards for IC quality and reliability verification
By David Abercrombie Potential pitfalls and available solutions.
By Saunder Peng Comparing results from different rule decks can be frustrating. Learn how you can use a chip finishing…
By Matthew Hogan, Mentor Graphics Calibre PERC can help you succeed in the automotive market
By Joseph Davis, Mentor Graphics The freePDK15 and its associated 15 nm Open Cell Library are now available!
By Joe Kwan, Mentor Graphics Precise curved geometries are vital to making silicon photonics technology work
By Matthew Hogan, Mentor Graphics Designing electronics for automotive use means meeting stringent safety and reliability standards.
By Joe Kwan, Mentor Graphics At 20 nm and below, designers must ensure their lithography simulation can incorporate and analyze…
