Mentor’s Battle of the Photonic Bulge

By Mitch Heins If silicon photonics verification is a battle to be won, Mentor Graphics…

All Together Now: FOWLP in the Foundry

By John Ferguson, Mentor Graphics FOWLP design popularity is driving foundries to develop in-house FOWLP…

The Pitfalls of Auto-Stitching in Double-Patterning

By David Abercrombie, Mentor Graphics Untimely DP stitching can cause more problems than it solves,…

Established Technology Nodes: The Most Popular Kid at the Dance

By Michael White, Mentor Graphics Established nodes have a lot of dancing left to do!…

Pattern Matching In Test and Yield Analysis

By Jonathan Muirhead and Geir Eide, Mentor Graphics Analyzing fail data with pattern matching helps…

Not yet a fan of fan-out? Why you should be!

By John Ferguson, Mentor Graphics FO-WLP combines multiple die from heterogeneous processes into a compact…

Pattern Matching in Design Verification

By Michael White, Mentor Graphics Automated pattern matching can solve a wide range of design…

When and How Should I Color My DP Layout?

By David Abercrombie, Mentor Graphics Automated DP coloring solutions minimize DP errors. But when is…

Five Steps to Double Patterning Debug Sucess

By David Abercrombie, Mentor Graphics Shhhh…David Abercrombie’s revealing the secrets of successful DP debugging!…