Want to know what went on at the TSMC OIP Forum this year? Here’s the inside scoop…

TSMC customers and partners always look forward to the annual TSMC Open Innovation Platform® (OIP) Forums. Here, they get the…

Early circuit verification can get you to tapeout faster…here’s how

For the last few years, it’s been hard to see design teams struggling to meet tapeout schedules caused by increasing…

Device Pin-Specific Property Extraction For Layout Simulation

Device Pin-Specific Property Extraction For Layout Simulation

By Phil Brooks, Mentor Graphics Can you accurately extract device pin-specific properties without creating phantom nets?  

Electromigration protection requires accurate interconnect modeling

Electromigration protection requires accurate interconnect modeling

By Karen Chow, Mentor Graphics Electromigration can destroy an IC before its time. Are your designs safe?

Reducing Post-Placement Leakage with Stress-Enhanced Fill Cells

Reducing Post-Placement Leakage with Stress-Enhanced Fill Cells

By Valeriy Sukharev, Jun-Ho Choy, Armen Kteyan and Henrik Hovsepyan, Mentor Graphics Optimizing power usage for mobile devices at advanced…

Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

By Karen Chow, Mentor Graphics Signal integrity analysis at advanced nodes requires new and enhanced parasitic extraction techniques

Parasitic extraction for touchscreen designs

Parasitic extraction for touchscreen designs

By Mohamed ElRefaee, Mentor Graphics Accurate parasitic extraction of touchscreens is essential for ensuring the high-quality performance the market demands

Extraction Challenges Grow in Advanced Nanometer IC Design

Extraction Challenges Grow in Advanced Nanometer IC Design

By Carey Robertson, Mentor Graphics The Calibre xACT platform is a new type of extraction tool that provides a range…

Parasitic Extraction of FinFET-based Memory Cells

Parasitic Extraction of FinFET-based Memory Cells

By Karen Chow, Mentor Graphics Accurate and efficient FinFET characterization requires a parasitic extraction tool that can apply different extraction…