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Siemens adds UltraSoC to Tessent for silicon lifecycle managment

Siemens adds UltraSoC to Tessent for silicon lifecycle managment

Brady Benware Vice President & GM, Tessent, Mentor, a Siemens Business We are excited to announce that Siemens plans to…

DFT productivity web seminar: Faster debug with Tessent Visualizer

DFT productivity web seminar: Faster debug with Tessent Visualizer

Learn how to take your DFT debug to the next level!

How to use logic BIST for automotive functional safety

How to use logic BIST for automotive functional safety

ICs for automotive applications need to meet stringent ISO 26262 functional safety requirements. To ensure automotive electronic systems operate safely at all times throughout the life of the vehicle, use logic built-in-self-test (BIST) as a safety mechanism.

It’s an exciting time—the rise of failure analysis for safety and yield

It’s an exciting time—the rise of failure analysis for safety and yield

The last decade has been marked by a few significant changes in the semiconductor business…

Mentor and Teradyne experts live web seminar: Silicon bring-up with ATE-Connect– register now!

Mentor and Teradyne experts live web seminar: Silicon bring-up with ATE-Connect– register now!

Here’s a great opportunity to tap into the silicon bring-up knowledge of experts from Mentor and Teradyne.

Automotive IC test web seminar – register now!

Automotive IC test web seminar – register now!

Calling all engineers involved in DFT and automotive IC design! Register now for a one-hour, live online web seminar from…

Tessent online seminars for at-home learning

Tessent online seminars for at-home learning

It’s May 2020, and many of us have been working from home for months. Because in-person technical training classes will…

Reclaim a competitive edge with advanced DFT

Reclaim a competitive edge with advanced DFT

Every new SoC project starts with grand hopes of being on time and under budget. Those early hopes are usually…

The latest in scan test and volume scan diagnosis

The latest in scan test and volume scan diagnosis

A new technique increases the throughput of scan diagnosis, leading to better failure analysis and yield improvement.