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current density

Electromigration protection requires accurate interconnect modeling

Electromigration protection requires accurate interconnect modeling

August 22, 2016

By Karen Chow, Mentor Graphics Electromigration can destroy an IC before its time. Are your designs safe?

By Design With Calibre
7 MIN READ
Leveraging Reliability-Focused Foundry Rule Decks

Leveraging Reliability-Focused Foundry Rule Decks

August 12, 2016

By Matthew Hogan, Mentor Graphics Using your foundry’s reliability rule deck early on lets you correct reliability issues while they…

By Design With Calibre
4 MIN READ
Interconnect Robustness Depends on Scaling for Reliability Analysis

Interconnect Robustness Depends on Scaling for Reliability Analysis

June 29, 2016

By Matthew Hogan, Mentor Graphics Fast simulation and PEX are both crucial to interconnect robustness verification. Can your tools scale…

By Design With Calibre
5 MIN READ
My Design’s Interconnect Has Enough Wire Width to Withstand ESD… Doesn’t It?

My Design’s Interconnect Has Enough Wire Width to Withstand ESD… Doesn’t It?

January 28, 2015

By Frank Feng, Mentor Graphics Electrostatic discharge can destroy a circuit, but designing adequate protection is not always a matter…

By Design With Calibre
5 MIN READ