By Neel Natekar Running dynamic simulations for full-chip ESD verification of ICs has become increasingly difficult (and in some cases,…
By Matthew Hogan and Derong Yan As we all know, during the final sign-off verifications of full chip system-on-chip (SoC)…
By Derong Yan As overall transistor dimensions shrink, integrated circuit (IC) chip designs become more sensitive to the damage caused…
By Dina Medhat Latch-up is modeled as a short circuit (low-impedance path) that occurs in an integrated circuit (IC). It…
The recent surge in used car prices may have you wondering what is driving this upswing, and just how much…
By Dina Medhat Electrostatic discharge (ESD) events cause severe damage to unprotected integrated circuits (ICs). You already know that, of…
By Neel Natekar As integrated circuits (ICs) grow in complexity, they create new challenges for IC verification flows and electronic…
By Sherif Hany and Abdellah Bakhali Regardless of which technology node they’re using, design houses that create high-voltage and multiple…
By Matthew Hogan How are you handling your reliability verification right now? Custom reliability verification? No reliability verification? How confident…
