Typical allocation of functional safety within an automotive SoC.

Webinar: Meet the Challenges of ISO 26262 with Tessent Test Solutions

Register Now! Tune in on June 9, 2022 at 11:00 am (pacific daylight time) to learn how to use Tessent…

Webinar: Smarter DFT architecture for advanced SoCs

Leonardo DaVinci said that “Simplicity is the ultimate sophistication.” Semiconductor design is a very complex process, and every step of…

Tessent earns TSMC OIP Partner of the Year for 3DFabric collaboration

Recognition of Tessent’s excellence in next-generation system-on-chip and 3DIC design enablement. Siemens EDA takes industry partnerships seriously, and sometimes we…

DFT webinar: A new method to find and optimize the most effective test patterns

Choosing the most efficient test patterns and setting coverage targets has always been a challenge and becomes even more daunting…

DFT and the competitive edge

Smart DFT for quality and TTM Don’t let your plans for successful new SoCs be derailed by a lack of…

Join Tessent at the VOICE Developer Conference

Tessent invites you to join us at the upcoming VOICE Developer Conference happening virtually from June 21-23, 2021. VOICE is…

RealizeLIVE + User2User

Don’t miss these Tessent sessions at Realize LIVE + User2User event – May 26, 2021

Explore the latest DFT, operations and embedded analytics technologies at Realize LIVE + U2U 2021. The May 26, 2021 user…

VTS 2020 best paper_Tessent

Tessent wins Best Paper award at IEEE VLSI Test Symposium

The best paper of the 2020 symposium describes a layout-friendly EDT decompressor that reduces routing congestion associated with decompressor circuitry…

Improve defect detection for competitive, high-quality SoCs

To deliver the highest quality SoCs, these manufacturing test strategies ensure defects are detected before it’s too late. It is…