Video from DAC: DFT for 2.5D and 3D designs with Tessent Multi-die

Learn how Tessent Multi-die software helps implement design-for-test structures for 2.5D and 3D designs. This video was recorded at the 2023 Design Automation Conference.

Video: STMicroelectronics improves test quality with Tessent defect-oriented test

Learn how STMicroelectronics used Tessent defect-oriented test to improve the quality of devices for their automotive customers. This video was recorded at the 2023 European User2User conference.

Video: Reducing test pattern count with testpoints

Learn how Qualcomm reduced test pattern count using Tessent testpoint technology. This video was recorded at the 2023 European User2User conference.

Video: Testonica uses Tessent IJTAG to implement an FPGA-based reference system

Learn how Testonica used Tessent to implement an FPGA-based reference system for pre-silicon evaluation and validation of a target IJTAG infrastructure. This video was recorded at the 2023 European User2User conference.

Video: NXP Semiconductors success with Tessent for in-system test for ISO 26262

Learn how NXP Semiconductors implemented in-system test for automotive devices using Tessent, recorded at the 2023 European User2User conference.

Video: Intel uses Tessent SSN for IC test and bring-up

Hear about Intel’s use of Tessent SSN for test and silicon bring up, recorded at the 2023 European User2User conference.

The future of in-system testing for automotive safety

Suppliers of IP for automotive applications must ensure their IP blocks are ISO 26262 compliant. Siemens has the solutions for automotive safety and reliability.

On-demand Webinar: Faster DFT, better results

Learn about faster DFT and better results using the bus-based packetized test of Tessent Streaming Scan Network.

Event: Tessent 2023 DFT Tech Forum

Attend the 2023 DFT Tech Forum to learn how Tessent silicon lifecycle solutions solve your complex SoC DFT challenges.