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Webinar: Building AI Chips that Deliver

Experts from Siemens, Groq, Hewlett Packard Enterprise, and Mythic team up to discuss AI chip design and deployment. Please join…

Don’t miss it: Automotive Test and Reliability at ITC-Asia 2021

At the 2021 IEEE International Test Conference, Tessent experts are presenting on bringing 1149.10 to life, progress in scan test…

Tessent at 2021 ITC-Asia

The 2021 IEEE International Test Conference is a virtual event this year, streaming live to the world from Wednesday, August…

Webinar – Optimize manycore AI and ML designs

Turn complexity into a competitive advantage by harnessing system-level data to optimize manycore AI and ML chips. Our new on-demand…

Tessent SystemInsight: simultaneous analysis of hardware and software in complex SoC designs

Newly renamed and upgraded, the Tessent™ SystemInsight integrated development environment (IDE) now supports cycle-accurate processor trace and a range of…

Manage automotive test, safety, and security with a safety island

The makers of automotive ICs are living in “interesting times.” These ICs no longer only run simple functions such as window…

Join Tessent at the VOICE Developer Conference

Tessent invites you to join us at the upcoming VOICE Developer Conference happening virtually from June 21-23, 2021. VOICE is…

Learn about on-chip monitoring and analysis with Tessent Embedded Analytics SDK

Large and complex SoCs with embedded systems play a big role in the technology we depend on, from intelligent 5G…

Read the 2020 ITC paper: Tessent Streaming Scan Network

At the 2020 International Test Conference, a paper by scientists from Siemens Digital Industries Software and Intel, describes how the…