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DFT and the competitive edge

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of glory. This one will be…

Tessent Wraps Up Summer Webinar Series

The summer of 2020 featured several new webinars from the Tessent Test Solutions group at Mentor, a Siemens business. These…

Video: ITC India 2020 keynote—Test community can take on silicon lifecycle challenges

The role of test is expanding from its traditional role into one that includes managing the entire silicon lifecycle. To…

Using critical area to optimize test patterns

Using critical area to optimize test patterns

In a new technical paper, Ron Press, the director of technology enablement for the Tessent Test Solutions, describes the new…

DFT Seminar: Using critical-area weighted optimization for more effective test patterns

DFT Seminar: Using critical-area weighted optimization for more effective test patterns

The world of ATPG just changed with the introduction of a new solution that can calculate the critical-area effectiveness of…

Tune in to ITC India 2020

Tune in to ITC India 2020

Mentor’s Tessent group is excited to participate in ITC India on July 12-14, 2020. While it is a virtual event…

Summer learning series seminar: Improving the throughput of volume scan diagnosis

Summer learning series seminar: Improving the throughput of volume scan diagnosis

Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and compute resources. Mentor offers a…

Mentor and Ambarella present: Automotive IC test web seminar

Mentor and Ambarella present: Automotive IC test web seminar

Ambarella used the Tessent software Safety ecosystem to successfully meet in-system test requirements and achieve ISO26262 automotive safety integrity level…

Watch: DFT reference flow for automotive ICs

Watch: DFT reference flow for automotive ICs

The market for automotive ICs is growing fast, and many designers are struggling to meet all the new challenges of…