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Tessent

Pattern Matching In Test and Yield Analysis

Pattern Matching In Test and Yield Analysis

August 1, 2016

By Jonathan Muirhead and Geir Eide, Mentor Graphics Analyzing fail data with pattern matching helps companies identify yield limiters faster…

By Design With Calibre
4 MIN READ
Designing and Testing FinFet-based IC Designs

Designing and Testing FinFet-based IC Designs

March 31, 2015

By Carey Robertson and Steve Pateras, Mentor Graphics Are your processes ready for finFETs?

By Design With Calibre
4 MIN READ