Sign In
Skip to content

Main Navigation

Blogs
  • Products
    • All Products
    • AMS Verification
    • Additive Manufacturing Software
    • Aprisa
    • Capital
    • Catchbook
    • Design with Calibre
    • EDA Consulting Services
    • Electronic Systems Design
    • Fibersim
    • HLS Design & Verification Blog
    • JT
    • Mendix
    • MindSphere
    • NX Design
    • NX Industrial Electrical Design
    • NX Manufacturing
    • Opcenter
    • PCBflow
    • PLM Components
    • Polarion
    • Questa
    • Semiconductor Packaging
    • Service Lifecycle Management
    • Simcenter
    • Solid Edge
    • Teamcenter
    • Teamcenter Manufacturing
    • Tecnomatix
    • Tessent Solutions
    • Valor
    • Valor DFM Solutions
  • Industries
    • Aerospace & Defense
    • Automotive & Transportation
    • Consumer Products & Retail
    • Electronics & Semiconductors
    • Energy & Utilities
    • Heavy Equipment
    • Industrial Machinery
    • Marine
    • Medical Devices & Pharmaceuticals
  • Podcasts
    • All Podcasts
    • 3D IC
    • AI Spectrum
    • Additive Manufacturing Podcast
    • Digital Powers Flexible: Consumer Products Podcast
    • Digital Transformation Podcast
    • Energy Transformation Podcast
    • Engineer Innovation Podcast
    • Innovation in the Classroom Podcast
    • Model Based Matters
    • Next Generation Design Podcast
    • Printed Circuit Podcast
    • Startups: Digitalization to Realization Podcast
    • Talking Aerospace Today Podcast
    • The Future Car Podcast
    • The Voice of Smart Digital Manufacturing Podcast
    • Where Today Meets Tomorrow Podcast
  • Thought Leadership
    • Thought Leadership Blog
    • Embedded Software
    • Expert Insights
    • Simulating the Real World
    • Verification Horizons
  • Corporate
    • Corporate Blog
    • Academic
    • Partners
    • Realize LIVE
    • Small & Medium Business
    • Xcelerator
    • Xcelerator Academy
  • Community
  1. Products
  2. News

ic reliability

Context-Aware Latch-up Checking

Context-Aware Latch-up Checking

October 17, 2016

By Matthew Hogan, Mentor Graphics Latch-up detection is challenging. Learn how automated LUP checks help you find and eliminate LUP…

By Design With Calibre
5 MIN READ
Electromigration protection requires accurate interconnect modeling

Electromigration protection requires accurate interconnect modeling

August 22, 2016

By Karen Chow, Mentor Graphics Electromigration can destroy an IC before its time. Are your designs safe?

By Design With Calibre
7 MIN READ
Electromigration and IC Reliability Risk

Electromigration and IC Reliability Risk

January 19, 2016

By Dina Medhat, Mentor Graphics Gradual damage from electromigration can affect product performance and reduce product lifetimes. Reliability analysis ensures…

By Design With Calibre
5 MIN READ
The Changing (and Challenging) IC Reliability Landscape

The Changing (and Challenging) IC Reliability Landscape

September 8, 2015

By Matthew Hogan, Mentor Graphics Reliability issues have gone way beyond DRC and LVS verification…

By Design With Calibre
6 MIN READ
Autonomous Systems and IC Reliability

Autonomous Systems and IC Reliability

June 2, 2015

By Matthew Hogan, Mentor Graphics New standards for IC quality and reliability verification

By Design With Calibre
6 MIN READ