electromigration

Stochasticity of the input current is an important factor in accurate EM assessment for on-chip power delivery networks

January 18, 2021

At every conference, there is always that anticipatory moment just before the coveted “Best Paper” awards are announced. After all,…

By Design With Calibre
2 MIN READ
Electromigration protection requires accurate interconnect modeling

Electromigration protection requires accurate interconnect modeling

August 22, 2016

By Karen Chow, Mentor Graphics Electromigration can destroy an IC before its time. Are your designs safe?

By Design With Calibre
7 MIN READ
Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

March 15, 2016

By Karen Chow, Mentor Graphics Signal integrity analysis at advanced nodes requires new and enhanced parasitic extraction techniques

By Design With Calibre
7 MIN READ
Electromigration and IC Reliability Risk

Electromigration and IC Reliability Risk

January 19, 2016

By Dina Medhat, Mentor Graphics Gradual damage from electromigration can affect product performance and reduce product lifetimes. Reliability analysis ensures…

By Design With Calibre
5 MIN READ