electromigration

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Cracking the code: ensuring reliability and performance in IC design with EM/IR analysis

August 5, 2024

By Karen Chow and Joel Mercier Integrated circuits (ICs) are everywhere, powering everything from washing machines and TVs to medical…

By Calibre IC Design & Manufacturing
6 MIN READ

Outta my way – electrons coming through!

September 7, 2022

By Joel Mercier and Karen Chow Ever been in a hurry to get to a meeting, but there were a…

By Calibre IC Design & Manufacturing
2 MIN READ

Stochasticity of the input current is an important factor in accurate EM assessment for on-chip power delivery networks

January 18, 2021

At every conference, there is always that anticipatory moment just before the coveted “Best Paper” awards are announced. After all,…

By Calibre IC Design & Manufacturing
2 MIN READ
Electromigration protection requires accurate interconnect modeling

Electromigration protection requires accurate interconnect modeling

August 22, 2016

By Karen Chow, Mentor Graphics Electromigration can destroy an IC before its time. Are your designs safe?

By Calibre IC Design & Manufacturing
7 MIN READ
Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

March 15, 2016

By Karen Chow, Mentor Graphics Signal integrity analysis at advanced nodes requires new and enhanced parasitic extraction techniques

By Calibre IC Design & Manufacturing
7 MIN READ
Electromigration and IC Reliability Risk

Electromigration and IC Reliability Risk

January 19, 2016

By Dina Medhat, Mentor Graphics Gradual damage from electromigration can affect product performance and reduce product lifetimes. Reliability analysis ensures…

By Calibre IC Design & Manufacturing
5 MIN READ