Cracking the code: ensuring reliability and performance in IC design with EM/IR analysis

By Karen Chow and Joel Mercier Integrated circuits (ICs) are everywhere, powering everything from washing machines and TVs to medical…

Outta my way – electrons coming through!

By Joel Mercier and Karen Chow Ever been in a hurry to get to a meeting, but there were a…

Stochasticity of the input current is an important factor in accurate EM assessment for on-chip power delivery networks

At every conference, there is always that anticipatory moment just before the coveted “Best Paper” awards are announced. After all,…

Electromigration protection requires accurate interconnect modeling

Electromigration protection requires accurate interconnect modeling

By Karen Chow, Mentor Graphics Electromigration can destroy an IC before its time. Are your designs safe?

Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

Parasitic Extraction for Accurate Signal Integrity Analysis at Advanced Nodes

By Karen Chow, Mentor Graphics Signal integrity analysis at advanced nodes requires new and enhanced parasitic extraction techniques

Electromigration and IC Reliability Risk

Electromigration and IC Reliability Risk

By Dina Medhat, Mentor Graphics Gradual damage from electromigration can affect product performance and reduce product lifetimes. Reliability analysis ensures…