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On-demand seminar: Improving the throughput of volume scan diagnosis

On-demand seminar: Improving the throughput of volume scan diagnosis

Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and compute resources. Mentor offers a…

Trends in DFT…according to you

Trends in DFT…according to you

A look at the top downloaded Tessent whitepapers reveals DFT challenges

Cut in-system time for automotive ICs

Cut in-system time for automotive ICs

A new logic built-in-self-test (LBIST) technology significantly improves cycle time for in-system tests of automotive devices.

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Learn about how Mentor and our partners, Advantest and Teradyne, are getting behind the IEEE 1149.10 standard for re-use of…

Test technologies enabling AI

Test technologies enabling AI

At the Silicon Valley DFT and Test Conference in Santa Clara, CA on October 23, the tight-knit community of DFT…

50 Years of International Test Conference

50 Years of International Test Conference

In 1970, the Beatles officially split, Apollo 13 narrowly averted disaster, paisley and stripes somehow went together, and the International…

Video tutorial: How to Increase Volume Scan Diagnosis Throughput by 10X

Video tutorial: How to Increase Volume Scan Diagnosis Throughput by 10X

Performing volume scan diagnosis on today’s large, advanced node designs puts outsized demands on turn-around-time and compute resources. Mentor offers…

Employing a Hierarchical Methodology for SoC Testing

Employing a Hierarchical Methodology for SoC Testing

When faced with a complex problem, engineers often employ a divide and conquer approach to efficiently come up with a…

Automotive electronics innovations in test quality

Automotive electronics innovations in test quality

The rapid development of advanced driver assistance systems and autonomous vehicles has grabbed the world’s attention and imagination. While true…