The quest for optimal DFT automation

The quest for optimal DFT automation

End-to-End automation keeps DFT out of the critical path

Broadcom case study using Tessent Connect to build DFT flow for AI chips

Broadcom case study using Tessent Connect to build DFT flow for AI chips

Broadcom developed an advanced, highly automated DFT flow for some of it’s biggest chips targeting the artificial intelligence (AI) market…

Tessent awarded by Samsung

Tessent awarded by Samsung

Everyone benefits from close collaborations between all the players in the semiconductor ecosystem.

On-demand seminar: Improving the throughput of volume scan diagnosis

On-demand seminar: Improving the throughput of volume scan diagnosis

Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and compute resources. Mentor offers a…

Trends in DFT…according to you

Trends in DFT…according to you

A look at the top downloaded Tessent whitepapers reveals DFT challenges

Cut in-system time for automotive ICs

Cut in-system time for automotive ICs

A new logic built-in-self-test (LBIST) technology significantly improves cycle time for in-system tests of automotive devices.

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Re-use high-speed IOs/SERDES for scan test with IEEE 1149.10

Learn about how Mentor and our partners, Advantest and Teradyne, are getting behind the IEEE 1149.10 standard for re-use of…

Test technologies enabling AI

Test technologies enabling AI

At the Silicon Valley DFT and Test Conference in Santa Clara, CA on October 23, the tight-knit community of DFT…

50 Years of International Test Conference

50 Years of International Test Conference

In 1970, the Beatles officially split, Apollo 13 narrowly averted disaster, paisley and stripes somehow went together, and the International…