SemiEngineering: Week In Review: Design, Low Power

SemiEngineering: Week In Review: Design, Low Power

Excerpt from article: “Week In Review: Design, Low Power“ Arm and Mentor are teaming up on a RTL Verification Design…

DFT and the competitive edge

Advanced DFT is your competitive edge Every new SoC project starts with grand hopes of glory. This one will be…

Tessent Wraps Up Summer Webinar Series

The summer of 2020 featured several new webinars from the Tessent Test Solutions group at Mentor, a Siemens business. These…

SemiEngineering: Custom Designs, Custom Problems

SemiEngineering: Custom Designs, Custom Problems

Excerpt from article: “Custom Designs, Custom Problems“ You have to put margin in your architecture. You have to leave a…

SemiEngineering: The Evolution Of High-Level Synthesis

SemiEngineering: The Evolution Of High-Level Synthesis

Excerpt from article: “The Evolution Of High-Level Synthesis“ The first panelist was Brian Bowyer, director of engineering for Siemens EDA. Bowyer…

SemiEngineering: Power And Performance Optimization At 7/5/3nm

SemiEngineering: Power And Performance Optimization At 7/5/3nm

Excerpt from article: “Power And Performance Optimization At 7/5/3nm“ At the edge, where people are building these new AI processors,…

Using critical area to optimize test patterns

Using critical area to optimize test patterns

In a new technical paper, Ron Press, the director of technology enablement for the Tessent Test Solutions, describes the new…

DFT Seminar: Using critical-area weighted optimization for more effective test patterns

DFT Seminar: Using critical-area weighted optimization for more effective test patterns

The world of ATPG just changed with the introduction of a new solution that can calculate the critical-area effectiveness of…

SemiWiki: #57DAC – Panel Discussion of High Level Synthesis

SemiWiki: #57DAC – Panel Discussion of High Level Synthesis

Excerpt from article: “Panel Discussion of High Level Synthesis“ Bryan Bowyer from Siemens EDA was the first to present, and…