In a new technical paper, Ron Press, the director of technology enablement for the Tessent Test Solutions, describes the new…
The world of ATPG just changed with the introduction of a new solution that can calculate the critical-area effectiveness of…
Mentor’s Tessent group is excited to participate in ITC India on July 12-14, 2020. While it is a virtual event…
Performing volume scan diagnosis on today’s large, advanced-node designs puts outsized demands on turn-around-time and compute resources. Mentor offers a…
Ambarella used the Tessent software Safety ecosystem to successfully meet in-system test requirements and achieve ISO26262 automotive safety integrity level…
The market for automotive ICs is growing fast, and many designers are struggling to meet all the new challenges of…
Brady Benware Vice President & GM, Tessent, Mentor, a Siemens Business We are excited to announce that Siemens plans to…
Learn how to take your DFT debug to the next level!
ICs for automotive applications need to meet stringent ISO 26262 functional safety requirements. To ensure automotive electronic systems operate safely at all times throughout the life of the vehicle, use logic built-in-self-test (BIST) as a safety mechanism.
