Automated shared bus interface memory test

Webinar: Memory test using a shared bus Interface

The explosive growth in the use of memory content on SoCs calls for a new solution to effectively access the…

Join Siemens EDA at GOMACTech 2022

Where design and innovation meets tomorrow Siemens EDA is looking forward to exhibiting a broad array of technologies spanning from…

Webinar: Smarter DFT architecture for advanced SoCs

Leonardo DaVinci said that “Simplicity is the ultimate sophistication.” Semiconductor design is a very complex process, and every step of…

ISTFA 2021

Don’t miss the 47th International Symposium for Testing and Failure Analysis (ISTFA 2021) in Phoenix, Arizona from October 31 to…

ITC 2021 logo

International Test Conference 2021

Join Siemens at the International Test Conference 2021 (ITC) to be held virtually from October 10-15, 2021. We’ll be showcasing technologies…

Watch videos from the AI Hardware Summit 2021

The AI Hardware Summit wrapped up on 15 September, 2021 at the Computer History Museum in Mountain View, CA. The…

Automotive electronics solutions at AESIN Conference 2021

A successful Automotive Electronics Innovation (AESIN) conference at the UK’s National Motorcycle Museum in Solihull wrapped up on 16 September…

Webinar: Reversible Scan Chain Technology Improves Diagnosis Resolution by 4X

Join Siemens and Qualcomm experts for a live, one-hour, online seminar: A Novel Reversible Scan Chain Technology that Improves Chain…

Tessent scan diagnosis at IPFA

IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2021) is a virtual event this year,…