Typical allocation of functional safety within an automotive SoC.

Webinar: Meet the Challenges of ISO 26262 with Tessent Test Solutions

Register Now! Tune in on June 9, 2022 at 11:00 am (pacific daylight time) to learn how to use Tessent…

D&R IP-SoC Day 2022 Silicon Valley

Siemens EDA talks cybersecurity at IP-SoC Silicon Valley

The Tessent group participated in the “unique event fully dedicated to IP and IP-based electronic systems,” D&R IP-SoC Silicon Valley…

Automated shared bus interface memory test

Webinar: Memory test using a shared bus Interface

The explosive growth in the use of memory content on SoCs calls for a new solution to effectively access the…

Learn about on-chip monitoring and analysis with Tessent Embedded Analytics SDK

Large and complex SoCs with embedded systems play a big role in the technology we depend on, from intelligent 5G…

Read the 2020 ITC paper: Tessent Streaming Scan Network

At the 2020 International Test Conference, a paper by scientists from Siemens Digital Industries Software and Intel, describes how the…

Tessent Silicon Lifecycle Solutions

What is silicon lifecycle management?

The next step in IC test and monitoring by Aileen Ryan – Senior Director of Portfolio Strategy, Siemens Digital Industries…

Tessent LBIST with Observation Scan Technology Wins Elektra Design Tool Award 2020

A Tessent technology was awarded the 2020 Elektra Design Tools and Development Software Award from a crowded field of nominated…

Improve defect detection for competitive, high-quality SoCs

To deliver the highest quality SoCs, these manufacturing test strategies ensure defects are detected before it’s too late. It is…

Tessent Wraps Up Summer Webinar Series

The summer of 2020 featured several new webinars from the Tessent Test Solutions group at Mentor, a Siemens business. These…