Tessent

Pattern Matching in Test and Yield Analysis

Pattern Matching in Test and Yield Analysis

August 1, 2016

By Geir Eide and Jonathan Muirhead Analyzing fail data with pattern matching helps companies identify yield limiters faster to increase…

By Tessent Solutions
4 MIN READ
Test Pattern Retargeting in 3D SICs using an IEEE 1687 based 3DFT architecture

Test Pattern Retargeting in 3D SICs using an IEEE 1687 based 3DFT architecture

April 8, 2016

Retarget your 2D test to 3D with IJTAG

By Tessent Solutions
< 1 MIN READ
Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

Hierarchical DFT: How to Do More, More Quickly, with Fewer Resources

March 15, 2016

By Rick Fisette, Mentor Graphics Is DFT a barrier to tapeout? Time to consider going hierarchical.

By Tessent Solutions
4 MIN READ